backscattering analysis

См. также в других словарях:

• Rutherford backscattering spectroscopy — Rutherford backscattering spectrometry (RBS) is an analytical technique used in materials science. Sometimes referred to as high energy ion scattering (HEIS) spectrometry, RBS is used to determine the structure and composition of materials by… …   Wikipedia

• Neutron backscattering — Science with Neutrons Foundations Neutron temperature Flux · Radiation  …   Wikipedia

• Coherent backscattering — In physics, coherent backscattering is observed when coherent radiation (such as a laser beam) propagates through a medium which has a large number of scattering centers (such as milk or a thick cloud) of size comparable to the wavelength of the… …   Wikipedia

• surface analysis — ▪ chemistry Introduction       in analytical chemistry (chemistry), the study of that part of a solid that is in contact with a gas or a vacuum. When two phases of matter are in contact, they form an interface. The term surface is usually… …   Universalium

• List of materials analysis methods — List of materials analysis methods: Contents: Top · 0–9 · A B C D E F G H I J K L M N O P Q R S T U V W X Y Z μSR see Muon spin spectroscopy …   Wikipedia

• Ion beam analysis — ( IBA ) is an important family of modern analytical techniques involving the use of MeV ion beams to probe the composition and obtain elemental depth profiles in the near surface layer of solids. All IBA methods are highly sensitive and allow the …   Wikipedia

• Rutherford Backscattering Spectrometry — (RBS), deutsch Rutherford Rückstreu Spektrometrie, ist eine Methode zur Untersuchung von oberflächennahen dünnen Schichten mit Hilfe von Ionenstrahlen. Es ist daher eng verwandt mit anderen Methoden der Ionenstreuspektroskopie, wie der… …   Deutsch Wikipedia

• Neutron activation analysis — Science with Neutrons Foundations Neutron temperature Flux · Radiation  …   Wikipedia

• Particle-induced X-ray emission — or proton induced X ray emission (PIXE) is a technique used in the determining of the elemental make up of a material or sample. When a material is exposed to an ion beam, atomic interactions occur that give off EM radiation of wavelengths in the …   Wikipedia

• Low-energy ion scattering — LEIS redirects here; for the Hawaiian garland see Lei (Hawaii). Low energy ion scattering spectroscopy (LEIS), sometimes referred to simply as ion scattering spectroscopy (ISS), is a surface sensitive analytical technique used to characterize the …   Wikipedia

• Particle-Induced X-ray Emission — or Proton Induced X ray Emission (PIXE) is a technique used in the determining of the elemental make up of a material or sample. When a material is exposed to an ion beam, atomic interactions occur that give off EM radiation of wavelengths in the …   Wikipedia